Homogeneity and Stability of the TR-M Geological Reference Material Confirmed

The latest-generation ICP-MS and XRF analyzers have been delivered to our laboratory. The new equipment increases analysis accuracy by 30% and significantly reduces test times.

What changes?

Compared to the older equipment, the new platform can simultaneously detect more than 50 elements at very low concentrations. This significantly improves quality control of reference materials.

• •ICP-MS Agilent 7900 — for trace elements
• •XRF S2 PUMA — solid sample analysis
• •Automated sample preparation system